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Technical Note

Design and Test of the Interlock Protection System for Extraction Power Supply of Negative Ion Source at ASIPP

ORCID Icon, , , , , , , , & show all
Pages 330-337 | Received 23 Jul 2018, Accepted 07 Dec 2018, Published online: 22 Feb 2019
 

Abstract

Negative ion beam source test equipment, currently under construction at Institute of Plasma Physics, Chinese Academy of Sciences, is a prototype of a radio-frequency (RF) ion source for neutral beam injection. An extraction grid power supply (EGPS) for the RF ion source is utilized to extract negative ions. To acquire the output of the EGPS and assure its safe operation, an interlock protection system has been designed. The system meets the requirements of anti-interference signal transmission and management of fast protection in order to minimize adverse consequences. The system takes care of breakdowns occurring during normal operation. All the required functions are implemented by hard-wired circuits, so the response time of fault protection can be less than 5μs. This technical note describes the rationale of the isolated transmission and protection functions and presents the implementation of functions in the detailed design. System performance during the experimental tests is described, with emphasis on demonstration of the protection.

Acknowledgments

This work is supported by the National Natural Science Foundation of China (contract numbers 11505225, 11505224, 11405207, and 11675215) and the Key Program of Research and Development of Hefei Science Center, Chinese Academy of Sciences (2016HSC-KPRD002).

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